Italy

ICPR 2020

The Fusion of Neural Architecture Search and Destruction and Construction Learning

technical paper

ICPR 2020 is the premier international conference on Pattern Recognition, gathering leading researchers from around the world to present their latest achievements in Pattern Analysis and Recognition, applied Artificial Intelligence and Machine Learning. The topic of the year is " Putting Artificial intelligence to work on Patterns". 
For the first time, ICPR has employed a two-round review process similar to journal submissions, with new papers allowed to be submitted in either the first or second round and papers submitted in the first round and not accepted allowed to be revised and re-submitted for second round review. 

In this edition of the **ICPR 2020** Conference, there are 1407 Oral/Poster presentations organized in five Tracks: 
- Artificial Intelligence, Machine Learning for Pattern Analysis; 
- Biometrics, Human Analysis and Behavior Understanding; Computer Vision, Robotics and Intelligent Systems; 
- Document and Media Analysis; and 
- Image and Signal Processing. 

The **ICPR 2020** Main Conference program also includes 7 Keynotes from prominent world-renowned scientists, 8 Tutorials, 28 Demos, 8 Challenges, 2 Panels, as well as an Industry/Sponsor Exhibition. In addition, 41 Workshops on a range of important current and emerging research topics complete the ICPR 2020 program. 


A Fully Automated Process for Semiconductor Technology Analysis through SEM Cross-Sections

BOE Digital Human: Visualize Your Life Data

Multimodal trajectory prediction in the CARLA simulator

Semantic Segmentation for Pedestrian Detection from Motion in Temporal Domain

Suspicious Activity Detection

Inter-Homines: Distance-Based Risk Estimation

Autonomous Platform based on Small-Scale Car for Versatile Data Collection and Algorithm Verification

Hardware-software Implementation of quantised Siamese Neural Networks for Energy Efficient Real-Time Object Tracking – a demo

Deep Learning based video analytics solutions running on board of smart cameras

Introduction to the Pollen Grain Classification Challenge

demo

https://d3smihljt9218e.cloudfront.net/transcript/9630/subtitle/40f647911d62fa725879d754f21fe4b9.vtt

English (automatic)

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A Fully Automated Process for Semiconductor Technology Analysis through SEM Cross-Sections

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Next from ICPR 2020

A Fully Automated Process for Semiconductor Technology Analysis through SEM Cross-Sections

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